This device contains three independent gates each of which performs the logic NAND function.

Features:

Automotive product qualification in accordance with AEC-Q100 (Grade 1)
 Specified from 40 C to +85 C and from 40 C to +125 C
 Complies with JEDEC standard JESD7A
 Input levels:
 For 74HC10-Q100: CMOS level
 For 74HCT10-Q100: TTL level
 ESD protection:
 MIL-STD-883, method 3015 exceeds 2000 V
 HBM JESD22-A114F exceeds 2000 V
 MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 )
 Multiple package options